Summary
The Department of Commerce’s National Institute of Standards and Technology (NIST) issued a Sources Sought (NB642050-26-01074) to conduct market research for a Field-Emission Scanning Electron Microscope (FE-SEM) with EBSD and EDS detectors and analytical software. Interested parties must submit a capability statement (via email to Sadaf.Afkhami@nist.gov) by July 31, 2026 at 9:00 AM Eastern time; no solicitation documents exist yet. The anticipated scope includes a site survey, freight delivery, full hardware/software installation and validation, training, an initial one-year warranty, and three one-year option periods for extended warranty/maintenance; place of performance is NIST Gaithersburg, MD.