Aug 17, 2026
Closes
Sep 1, 2026
Phenom Pharos G2 Desktop Model Scanning Electron Microscope (SEM) *SOLE SOURCE*
Purchase of Phenom Pharos G2 desktop model scanning electron microscope (SEM) with field emission electron beam source and an energy dispersive x-ray spectroscopy (EDS) detector capable of elemental mapping. There are two types of beams, field emission and tungsten filament. Traditional tungsten filaments are limited to approximately 250,000x magnification whereas a field emission source can achieve up to 8 times greater resolution (up to 2,000,000x magnification), which permits imaging particles with sizes of just a few nanometers. As such, the 2 key requirements for this procurement are a field emission electron beam source and elemental mapping capability. Only the Phenom Pharos G2 desktop scanning electron microscope (SEM) with field emission electron beam source and an energy dispersive x-ray spectroscopy (EDS) detector capable of elemental mapping.
