Combined Sources Sought Notice and Notice of Intent to Award a Sole Source Contract for ScanWave Pro electronic controller for a Vero AFM

Description: NIST is conducting market research to identify alternative sources for a scanning Microwave Impedance Microscopy (sMIM) electronic controller compatible with its government-owned Vero Atomic Force Microscope. The controller must replace the existing modular microwave electronics assembly, provide substantially improved measurement sensitivity, support multimodal characterization, and include the manufacturer's standard commercial warranty. Interested sources must submit the requested company and product information in Word, PDF, or Excel format by the response deadline; NIST has not yet determined its acquisition strategy.