Field-Emission Scanning Electron Microscope (FE-SEM) with Electron Backscatter Diffraction (EBSD) and Energy Dispersive Spectroscopy (EDS) Detectors and Analytical Software

Description: The National Institute of Standards and Technology is soliciting quotations for one brand-name-only analytical field-emission scanning electron microscope equipped with Electron Backscatter Diffraction (EBSD) and Energy Dispersive Spectroscopy (EDS) detectors and analytical software. The issuing office is NIST's Acquisition Management Division in Gaithersburg, Maryland, and the solicitation is classified as laboratory equipment. Quotations are due September 15, 2026, at 9:00 AM Eastern Daylight Time.