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Field-Emission Scanning Electron Microscope (FE-SEM) with Brand Name Only Electron Backscatter Diffraction (EBSD) (Request for Quotations)

Description: 1 ea, field emission scanning electron microscopt (FE-SEM) with brand name oxford electron backscatter diffraction (EBSD) and energy dispersive spectroscopy (EDS) detectors and analytical software.

Buyer: Department of Commerce NIST
Federal · MD, US
Released: Sep 1, 2026
Closes: Sep 15, 2026(5 days left)

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Key Contacts

Decision makers connected to this RFP from Department of Commerce NIST.

Mark S. MadsenActing Chief Counsel

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Andy WrightActing Chief Facilities Management Officer (CFMO) and Director of the Office of Facilities and Property Management (OFPM)

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+1 (***) ***-****

Nahla IvyChief, Enterprise Risk Management Office

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Sean SellChief Information Officer (Acting)

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