Naval Air Systems Command (NAVAIR)
FederalMD
Aug 17, 2026
Closes
Sep 1, 2026
Hitachi FESEM (Field Emission Scanning Electron Microscope) Maintenance *SOLE SOURCE* RFP
Hitachi FESEM (field emission scanning electron microscope) maintenance.
Description: The National Institutes of Health issued a presolicitation for a firm-fixed-price maintenance agreement covering a government-owned Hitachi S-4800 Scanning Electron Microscope located in Bethesda, Maryland, with a base period and three option years. The required services include all parts and labor, unlimited on-site emergency service with a 48-hour response time, and annual preventive maintenance. The procurement is intended as a sole-source action for Hitachi High-Tech America under FAR 6.302-1, but qualified businesses may submit capability statements by August 28, 2026, at 9:00 a.m. EDT.
Federal · MD, US
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Naval Air Systems Command (NAVAIR)
FederalMD
Aug 17, 2026
Closes
Sep 1, 2026
Hitachi FESEM (field emission scanning electron microscope) maintenance.
Texas Department of Transportation
State AgencyTX
Aug 14, 2026
Closes
Aug 28, 2026
The Texas Department of Transportation is seeking bids to purchase two Scanning Electron Microscope (SEM) detector systems for its Materials and Tests Division. The contract includes delivery, installation, calibration, and training for the systems. It also includes a one-year service plan with up to three optional one-year renewal periods.
Texas Department of Transportation
State AgencyTX
Aug 14, 2026
Closes
Aug 28, 2026
The Texas Department of Transportation is seeking bids to purchase two Scanning Electron Microscope (SEM) detector systems for its Materials and Tests Division. The contract includes delivery, installation, calibration, and training for the systems. It also includes a one-year service plan with up to three optional one-year renewal periods.
Aug 17, 2026
Closes
Sep 1, 2026
The Centers for Disease Control and Prevention intends to award a sole-source, firm-fixed-price purchase order to Nanoscience Instruments for one Phenom Pharos G2 desktop model scanning electron microscope. The microscope must have a field-emission electron beam source and an energy-dispersive X-ray spectroscopy detector capable of elemental mapping. The notice is not a request for competitive quotations, but responses received by the deadline will be considered by the Government.