Summary
The University of Notre Dame du Lac seeks to procure a Deep Level Transient Spectroscopy (DLTS) measurement system that combines custom electronics with a cryogenic probe station for electrical characterization of semiconductor samples. The system must support external light sources, be integrated and controlled through a single software suite to enable automated experiments across temperatures and light excitations, and accommodate two- and three-terminal devices typical in a university research environment. This is a one-time buy with place of performance at the University of Notre Dame; questions and responses must be submitted through the University's procurement portal.