Summary
Requires a microelectronic characterization system capable of performing thin-film device testing and current-voltage (iv) analysis with nano-ampere level sensitivity at voltages up to 40v. The system must support advanced research involving memristor device characterization and enable the replication of measurement methodologies documented in peer-reviewed publications. These research activities require highly precise, repeatable measurements that can only be achieved through a tightly integrated hardware and software environment designed specifically for semiconductor device analysis. In addition to the instrumentation, the university requires a complete solution that includes manufacturer-provided installation, testing, and configuration services to ensure the system performs accurately at the required sensitivity and meets research-grade validation standards upon deployment.