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NASA seeks to procure one micro x-ray source to detect defects in thin-walled, additively-manufactured metallic structures; the requirement includes procurement, fabrication, and delivery to meet specified technical performance (e.g., 40–130 kV, 10–300 µA, focal spot ≤10 µm). The solicitation is a Combined Synopsis/Solicitation (Notice ID 80NSSC26922252Q), issued as a Total Small Business set-aside under NAICS 334519 with PSC 6640, and identifies Hampton, VA as the place of performance. Offers are due Jan 20, 2026 16:00 CST (2026-01-20T22:00:00Z) and the opportunity is active as of 2026-01-15.
Starbridge can help you:
Pain points mentioned in board meetings and strategic plans
Instantly outline and draft all requirements
Bring in your USPs and exploit competitor gaps
Starbridge can help you:
Get ahead of RFPs — target accounts planning budget or ending contracts soon
Accounts with contract expirations, meetings mentioning your product, grants, budget changes and more
Starbridge.ai books 30 - 40% of leads into meetings
Provide micro x-ray computed tomography system. Quantity: One (1) EA.
Posted Date
Jan 6, 2026
Due Date
Jan 27, 2026
Release: Jan 6, 2026
Close: Jan 27, 2026
Provide micro x-ray computed tomography system. Quantity: One (1) EA.
The National Institute of Standards and Technology (NIST) is conducting a sources-sought/RFI to identify potential commercial providers of a micro X-ray Computed Tomography (µXCT) system to support advanced semiconductor research under the CHIPS for America Act. The system must image millimeter-scale specimens with nanometer resolution and include capabilities such as ≤500 nm spatial resolution, ≤50 nm voxel size, a sealed tube up to 160 kV, 360° rotation stage, high-resolution X-ray detector (>20 MP), integrated reconstruction software, radiation-safe enclosure, and remote operation. This is a market research / sources-sought notice (not a grant or an active contract solicitation); responses are due January 27, 2026.
Posted Date
Jan 6, 2026
Due Date
Jan 27, 2026
Release: Jan 6, 2026
Close: Jan 27, 2026
The National Institute of Standards and Technology (NIST) is conducting a sources-sought/RFI to identify potential commercial providers of a micro X-ray Computed Tomography (µXCT) system to support advanced semiconductor research under the CHIPS for America Act. The system must image millimeter-scale specimens with nanometer resolution and include capabilities such as ≤500 nm spatial resolution, ≤50 nm voxel size, a sealed tube up to 160 kV, 360° rotation stage, high-resolution X-ray detector (>20 MP), integrated reconstruction software, radiation-safe enclosure, and remote operation. This is a market research / sources-sought notice (not a grant or an active contract solicitation); responses are due January 27, 2026.
One-time purchase of x-ray inspection meters.
Posted Date
Oct 17, 2025
Due Date
Jan 28, 2026
Release: Oct 17, 2025
Close: Jan 28, 2026
One-time purchase of x-ray inspection meters.
AvailableSupply and delivery of handheld x-ray fluorescence for erdc gsl.
Posted Date
Nov 26, 2025
Due Date
Dec 4, 2026
Release: Nov 26, 2025
Close: Dec 4, 2026
Supply and delivery of handheld x-ray fluorescence for erdc gsl.
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