Sources Sought Notice - Narrowband Mid-IR laser with tunable wavelength and tunable repetition rate (NIST-SS26-CHIPS-66)

Narrowband, mid-IR laser with tunable wavelength and tunable repetition rate to enhance advanced AFM metrology for measuring thermal properties of materials at the nanoscale.

The National Institute of Standards and Technology (NIST) has issued a Sources Sought notice for an Environmental Test Chamber to support its CHIPS Metrology program. This market research notice requests vendor capability statements and product details. It explicitly states that it is not a commitment to award a contract.

This is a Sources Sought (market research) notice from the National Institute of Standards and Technology (NIST) seeking information on manufacturers/suppliers that can provide a 67 GHz microwave source (signal generator) for characterization of piezoelectric microwave acoustic resonators. The notice lists technical specifications, key capabilities, and response instructions and explicitly states it is for market research and not a solicitation for award. Responses are to be submitted by email to the points of contact and are not offers — no award will be made from this notice.

The National Institute of Standards and Technology (NIST) is seeking information for a laser confocal microscope to support the CHIPS Metrology program for imaging photonic integrated circuits and measuring device dimensions and roughness. The system must support multiple imaging modalities (laser confocal, white light interferometry, depth-from-focus, brightfield), automated measurement and programmable measurement of an entire 100 mm wafer, and include a high-resolution camera and motorized stage. This notice is a combined Sources Sought / Notice of Intent to Sole Source (Solicitation ID: NIST-SS26-CHIPS-61) posted with an open date of 2026-01-14 and a close date of 2026-01-26.