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The National Institute of Standards and Technology (NIST) is seeking information from sources capable of providing Optical Frequency Comb Systems to support metrology research for materials purity, properties, and provenance. The systems should perform broadband spectroscopy and spectroradiometer calibrations across the mid-wave and far-wave infrared, generate broadband spectral reference data, evaluate spectrometer performance, interrogate gas samples, and be customizable to meet NIST specifications. This posting is a Sources Sought / Request for Information to identify capable sources, not a grant program.
Starbridge can help you:
Pain points mentioned in board meetings and strategic plans
Instantly outline and draft all requirements
Bring in your USPs and exploit competitor gaps
Starbridge can help you:
Get ahead of RFPs — target accounts planning budget or ending contracts soon
Accounts with contract expirations, meetings mentioning your product, grants, budget changes and more
Starbridge.ai books 30 - 40% of leads into meetings
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Mid-IR optical frequency comb.
Posted Date
Nov 19, 2025
Due Date
Dec 3, 2026
Release: Nov 19, 2025
Close: Dec 3, 2026
Mid-IR optical frequency comb.
AvailableThe National Institute of Standards and Technology (NIST) Materials Science and Engineering Division issued a sources-sought notice to conduct market research and identify potential suppliers for an amplifier to integrate into NIST’s Absolute Magnetometer for SI-traceable magnetic moment measurements. The notice describes technical requirements (e.g., DC to ≥250 kHz bandwidth, 0–250 VRMS output voltage, 0–180 ARMS output current, ≥12 kW power, low distortion) and requests capability responses by email with company/contact details; it is a market research pre-solicitation (not a grant). The sources-sought was posted Dec 3, 2025 and requests responses by Dec 17, 2025, and the posting is active on SAM.gov.
Posted Date
Dec 3, 2025
Due Date
Dec 17, 2025
Release: Dec 3, 2025
Close: Dec 17, 2025
The National Institute of Standards and Technology (NIST) Materials Science and Engineering Division issued a sources-sought notice to conduct market research and identify potential suppliers for an amplifier to integrate into NIST’s Absolute Magnetometer for SI-traceable magnetic moment measurements. The notice describes technical requirements (e.g., DC to ≥250 kHz bandwidth, 0–250 VRMS output voltage, 0–180 ARMS output current, ≥12 kW power, low distortion) and requests capability responses by email with company/contact details; it is a market research pre-solicitation (not a grant). The sources-sought was posted Dec 3, 2025 and requests responses by Dec 17, 2025, and the posting is active on SAM.gov.
AvailableNIST issued a Sources Sought notice (NIST-SS26-CHIPS-42) seeking information for an optical microscope to support nondestructive defect detection metrology for semiconductor advanced packaging. The notice lists detailed hardware, camera, motorized stage, objective lens, and software requirements and requests capability statements and other market research information via email to the primary point of contact. Questions must be submitted by December 15, 2025, and responses are due by December 23, 2025 at 5:00 p.m. EST.
Posted Date
Dec 9, 2025
Due Date
Dec 23, 2025
Release: Dec 9, 2025
Close: Dec 23, 2025
NIST issued a Sources Sought notice (NIST-SS26-CHIPS-42) seeking information for an optical microscope to support nondestructive defect detection metrology for semiconductor advanced packaging. The notice lists detailed hardware, camera, motorized stage, objective lens, and software requirements and requests capability statements and other market research information via email to the primary point of contact. Questions must be submitted by December 15, 2025, and responses are due by December 23, 2025 at 5:00 p.m. EST.
The National Institute of Standards and Technology (NIST) issued a Sources Sought (NIST-SS26-CHIPS-25) to conduct market research and identify potential sources for a Coupled Device Detector Camera System under the CHIPS RF Waveform and Rapid Frequency Comb Diagnostics for Plasma Etching Project. NIST requests one camera with an integrated intensifier and IEMCCD sensor (specified performance parameters) plus control/data analysis software compatible with NIST-supplied computers. Responses are due Dec 15, 2025; the notice is a sources-sought market research notice (not a grant) and is listed on SAM.gov.
Posted Date
Dec 1, 2025
Due Date
Dec 15, 2025
Release: Dec 1, 2025
Close: Dec 15, 2025
The National Institute of Standards and Technology (NIST) issued a Sources Sought (NIST-SS26-CHIPS-25) to conduct market research and identify potential sources for a Coupled Device Detector Camera System under the CHIPS RF Waveform and Rapid Frequency Comb Diagnostics for Plasma Etching Project. NIST requests one camera with an integrated intensifier and IEMCCD sensor (specified performance parameters) plus control/data analysis software compatible with NIST-supplied computers. Responses are due Dec 15, 2025; the notice is a sources-sought market research notice (not a grant) and is listed on SAM.gov.
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