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The National Institute of Standards and Technology (NIST) is seeking to procure an Advascope ePix EFE TPX3 SEM detector system with extended front-end electronics, vacuum compatibility, a 100 mm silicon sensor interface, custom base, AdvaBoard USB-C readout with external trigger/clock support, and a Peltier-cooled heatsink with PID control. The acquisition includes a manual detector retract mechanism and supports NIST's CHIPS-related measurement science work to improve semiconductor supply chain visibility and 2D/WBG materials metrology. The notice is a pre-solicitation posted 2026-01-13 with responses due 2026-01-27, and it lists NAICS 334516 and PSC 6640 with no set-aside designation.
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This project requires a detector that can be used in a conventional scanning electron microscope (SEM) to collect electron diffraction patterns at fast rate on samples comprising 2D material-based devices larger than cannot be fit or analyzed by a conventional transmission electron microscope (TEM). The diffraction patterns will be used to complement and extend existing SEM analytical capabilities, and also for the development of new imaging and diffraction modes that will be used to understand the reliability of 2D materials-based electronic devices as part of the CHIPS project entitled Evaluation of 2D and WBG Material Quality toward Device Reliability.
Posted Date
Jan 13, 2026
Due Date
Jan 27, 2026
Release: Jan 13, 2026
Close: Jan 27, 2026
This project requires a detector that can be used in a conventional scanning electron microscope (SEM) to collect electron diffraction patterns at fast rate on samples comprising 2D material-based devices larger than cannot be fit or analyzed by a conventional transmission electron microscope (TEM). The diffraction patterns will be used to complement and extend existing SEM analytical capabilities, and also for the development of new imaging and diffraction modes that will be used to understand the reliability of 2D materials-based electronic devices as part of the CHIPS project entitled Evaluation of 2D and WBG Material Quality toward Device Reliability.
AvailableDetector, ice, NSN: 6340-00-304-5556RK.
Posted Date
Sep 25, 2025
Due Date
Sep 25, 2026
Release: Sep 25, 2025
Close: Sep 25, 2026
Detector, ice, NSN: 6340-00-304-5556RK.
Available2 Ea Detector, ice, National Stock Number 6350015186871, Part Number 07482 L22428P15.
Posted Date
Jan 9, 2026
Due Date
Feb 9, 2026
Release: Jan 9, 2026
Close: Feb 9, 2026
2 Ea Detector, ice, National Stock Number 6350015186871, Part Number 07482 L22428P15.
AvailableDetector, Ionization, NSN 4210005955139, Qty 174 UI Ea
Posted Date
Jan 14, 2026
Due Date
Jan 26, 2026
Release: Jan 14, 2026
Close: Jan 26, 2026
Detector, Ionization, NSN 4210005955139, Qty 174 UI Ea
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