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The Department of the Navy issued Solicitation N6852026Q1014 seeking a Platinum-level maintenance and calibration service plan for an Olympus LEXT 3D Measuring Laser Microscope at Fleet Readiness Center East. This procurement is a firm-fixed-price, total small business set-aside requiring yearly preventative maintenance and NIST-traceable calibration certificates. Quotes are to be submitted via email to the contracting point of contact by the specified deadline in February 2026.
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Pain points mentioned in board meetings and strategic plans
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Platinum level service plan for Olympus 3D measuring laser microscope, S/N: 8L50067.
Posted Date
Jan 22, 2026
Due Date
Feb 5, 2026
Release: Jan 22, 2026
Close: Feb 5, 2026
Platinum level service plan for Olympus 3D measuring laser microscope, S/N: 8L50067.
AvailableRelease: Jan 14, 2026
Close: Jan 26, 2026
1 ea, confocal microscope.
AvailableThe National Institute of Standards and Technology (NIST) is seeking information for a laser confocal microscope to support the CHIPS Metrology program for imaging photonic integrated circuits and measuring device dimensions and roughness. The system must support multiple imaging modalities (laser confocal, white light interferometry, depth-from-focus, brightfield), automated measurement and programmable measurement of an entire 100 mm wafer, and include a high-resolution camera and motorized stage. This notice is a combined Sources Sought / Notice of Intent to Sole Source (Solicitation ID: NIST-SS26-CHIPS-61) posted with an open date of 2026-01-14 and a close date of 2026-01-26.
Posted Date
Jan 14, 2026
Due Date
Jan 26, 2026
Release: Jan 14, 2026
Close: Jan 26, 2026
Sale of scanning electron microscope & components.
Posted Date
-
Due Date
Jan 28, 2026
Close: Jan 28, 2026
Sale of scanning electron microscope & components.
AvailableSurface intent from meeting minutes, budgets, and contract expirations. Influence RFP requirements before competitors ever see them.
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The National Institute of Standards and Technology (NIST) is seeking information for a laser confocal microscope to support the CHIPS Metrology program for imaging photonic integrated circuits and measuring device dimensions and roughness. The system must support multiple imaging modalities (laser confocal, white light interferometry, depth-from-focus, brightfield), automated measurement and programmable measurement of an entire 100 mm wafer, and include a high-resolution camera and motorized stage. This notice is a combined Sources Sought / Notice of Intent to Sole Source (Solicitation ID: NIST-SS26-CHIPS-61) posted with an open date of 2026-01-14 and a close date of 2026-01-26.
Available