When is the deadline for the Suny Polytechnic Institute RFP?

The deadline for this RFP is Jul 28, 2026. Make sure to submit your proposal before this date to be considered.

What is Suny Polytechnic Institute looking for?

SUNY Polytechnic Institute is soliciting competitive bids for the procurement of three advanced scientific instruments: a Bench Top Scanning Electron Microscope (SEM), an X-ray Photoelectron Spectroscopy (XPS) System, and a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for use in an educational setting. Vendors must submit bids electronically to bids@sunypoly.

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Multi-Equipment Bid — Bench Top SEM, XPS System, and FIB‑SEM Note: Submission of questions by 3:00PM on July 20, 2026 - Suny Polytechnic Institute Bid & RFP - Due Jul 28, 2026

Multi-Equipment Bid — Bench Top SEM, XPS System, and FIB‑SEM

Available

State University of New York System Office

The State University of New York (SUNY) Polytechnic Institute is soliciting bids (Solicitation IFB 25-45) for the supply of advanced laboratory instrumentation, including a Bench Top Scanning Electron Microscope (SEM) with EDS and EBSD, an X-ray Photoelectron Spectroscopy (XPS) System with depth profiling and imaging, and a Focused Ion Beam-Scanning Electron Microscope (FIB-SEM). Vendors must be OEMs or authorized dealers with at least ten years of experience, and equipment must carry U.S. safety certifications (UL/NRTL), comply with OSHA, and include a minimum three-year warranty with service response within five business days. Bidders must deliver, install, and provide on-site training (minimum two full days per instrument) at SUNY Poly's Utica campus; the procurement is subject to New York State Finance Law § 139j & k (Lobbying Law).

Posted Date

Jul 3, 2026

Due Date

Jul 28, 2026

View Details →

Multi-Equipment Bid — Bench Top SEM, XPS System, and FIB‑SEM

Release: Jul 3, 2026

State University of New York System Office

Close: Jul 28, 2026

The State University of New York (SUNY) Polytechnic Institute is soliciting bids (Solicitation IFB 25-45) for the supply of advanced laboratory instrumentation, including a Bench Top Scanning Electron Microscope (SEM) with EDS and EBSD, an X-ray Photoelectron Spectroscopy (XPS) System with depth profiling and imaging, and a Focused Ion Beam-Scanning Electron Microscope (FIB-SEM). Vendors must be OEMs or authorized dealers with at least ten years of experience, and equipment must carry U.S. safety certifications (UL/NRTL), comply with OSHA, and include a minimum three-year warranty with service response within five business days. Bidders must deliver, install, and provide on-site training (minimum two full days per instrument) at SUNY Poly's Utica campus; the procurement is subject to New York State Finance Law § 139j & k (Lobbying Law).

Available

View Details →

JEOL SEM PM

Available

Air Force Sustainment Center

The Air Force Sustainment Center (AFSC/PZIMB) at Tinker Air Force Base (U.S. Department of Defense) intends to award a sole-source, firm-fixed-price procurement for a JEOL SEM PM covering one base year plus four option years. The solicitation (Request for Quotation FA812626Q0052) requires the contractor to supply the specified equipment and documentation per the attached Performance Work Statement and includes several attachments (solicitation PDF, wage determination, Appendix C, PWS, equipment list). The public posting shows an open date of 2026-07-16 and a close date of 2026-07-23, and lists Alicia McGill (alicia.mcgill@us.af.mil) as the contract specialist contact.

Posted Date

-

Due Date

Jul 23, 2026

View Details →

JEOL SEM PM

Release: -

Air Force Sustainment Center

Close: Jul 23, 2026

The Air Force Sustainment Center (AFSC/PZIMB) at Tinker Air Force Base (U.S. Department of Defense) intends to award a sole-source, firm-fixed-price procurement for a JEOL SEM PM covering one base year plus four option years. The solicitation (Request for Quotation FA812626Q0052) requires the contractor to supply the specified equipment and documentation per the attached Performance Work Statement and includes several attachments (solicitation PDF, wage determination, Appendix C, PWS, equipment list). The public posting shows an open date of 2026-07-16 and a close date of 2026-07-23, and lists Alicia McGill (alicia.mcgill@us.af.mil) as the contract specialist contact.

Zeiss EVO-15 Scanning Electron Microscope (SEM) Maintenance

Available

Bureau of Engraving and Printing

The contractor would be expected to provide: One annual preventive maintenance visit. Technical inspection, testing, calibration, adjustment, alignment, and servicing required to maintain instrument functionality. Remote and/or on-site troubleshooting support. Response to service requests within 48 business hours. Annual PM reporting documenting findings and corrective actions. See attached file.

Posted Date

Jun 11, 2026

Due Date

Jul 24, 2026

View Details →

Zeiss EVO-15 Scanning Electron Microscope (SEM) Maintenance

Release: Jun 11, 2026

Bureau of Engraving and Printing

Close: Jul 24, 2026

The contractor would be expected to provide: One annual preventive maintenance visit. Technical inspection, testing, calibration, adjustment, alignment, and servicing required to maintain instrument functionality. Remote and/or on-site troubleshooting support. Response to service requests within 48 business hours. Annual PM reporting documenting findings and corrective actions. See attached file.

NovaNano SEM 630 Preventative Maintenance Services SOLE SOURCE RFP

Available

U.S. Army Engineer District Vicksburg

Repair and preventative maintenance services of instrumentation NovaNano Scanning Electron Microscope (SEM) 630.

Posted Date

Jul 15, 2026

Due Date

Jul 21, 2026

View Details →

NovaNano SEM 630 Preventative Maintenance Services SOLE SOURCE RFP

Release: Jul 15, 2026

U.S. Army Engineer District Vicksburg

Close: Jul 21, 2026

Repair and preventative maintenance services of instrumentation NovaNano Scanning Electron Microscope (SEM) 630.

Available

View Details →

Summary

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Files

Contacts & Company Data

Competitor Intelligence

Multi-Equipment Bid — Bench Top SEM, XPS System, and FIB‑SEM Note: Submission of questions by 3:00PM on July 20, 2026

Summary

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Win These Opportunities Next

Files

Contacts & Company Data

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Multi-Equipment Bid — Bench Top SEM, XPS System, and FIB‑SEM

Multi-Equipment Bid — Bench Top SEM, XPS System, and FIB‑SEM

JEOL SEM PM

JEOL SEM PM

Zeiss EVO-15 Scanning Electron Microscope (SEM) Maintenance

Zeiss EVO-15 Scanning Electron Microscope (SEM) Maintenance

NovaNano SEM 630 Preventative Maintenance Services SOLE SOURCE RFP

NovaNano SEM 630 Preventative Maintenance Services SOLE SOURCE RFP

Win Opportunities Before the RFP

Summary

What to Include In Your Proposal

Win These Opportunities Next

Files

Contacts & Company Data

Competitor Intelligence

Multi-Equipment Bid — Bench Top SEM, XPS System, and FIB‑SEM Note: Submission of questions by 3:00PM on July 20, 2026

Summary

What to Include In Your Proposal

Win These Opportunities Next

Files

Contacts & Company Data

Competitor Intelligence

More Opportunities Like This

Multi-Equipment Bid — Bench Top SEM, XPS System, and FIB‑SEM

Multi-Equipment Bid — Bench Top SEM, XPS System, and FIB‑SEM

JEOL SEM PM

JEOL SEM PM

Zeiss EVO-15 Scanning Electron Microscope (SEM) Maintenance

Zeiss EVO-15 Scanning Electron Microscope (SEM) Maintenance

NovaNano SEM 630 Preventative Maintenance Services *SOLE SOURCE* RFP

NovaNano SEM 630 Preventative Maintenance Services *SOLE SOURCE* RFP

Win Opportunities Before the RFP

NovaNano SEM 630 Preventative Maintenance Services SOLE SOURCE RFP

NovaNano SEM 630 Preventative Maintenance Services SOLE SOURCE RFP