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Provide field-emission scanning electron microscope (fe sem) system. 1 EA. See attached file.
Starbridge can help you:
Pain points mentioned in board meetings and strategic plans
Instantly outline and draft all requirements
Bring in your USPs and exploit competitor gaps
Starbridge can help you:
Get ahead of RFPs — target accounts planning budget or ending contracts soon
Accounts with contract expirations, meetings mentioning your product, grants, budget changes and more
Starbridge.ai books 30 - 40% of leads into meetings
Premium
Access the largest public sector contact database
Premium
Get complete source documentation & analysis
Sale of scanning electron microscope & components.
Posted Date
-
Due Date
Jan 28, 2026
Close: Jan 28, 2026
Sale of scanning electron microscope & components.
AvailableThis project requires a detector that can be used in a conventional scanning electron microscope (SEM) to collect electron diffraction patterns at fast rate on samples comprising 2D material-based devices larger than cannot be fit or analyzed by a conventional transmission electron microscope (TEM). The diffraction patterns will be used to complement and extend existing SEM analytical capabilities, and also for the development of new imaging and diffraction modes that will be used to understand the reliability of 2D materials-based electronic devices as part of the CHIPS project entitled Evaluation of 2D and WBG Material Quality toward Device Reliability.
Posted Date
Jan 13, 2026
Due Date
Jan 27, 2026
Release: Jan 13, 2026
Close: Jan 27, 2026
This project requires a detector that can be used in a conventional scanning electron microscope (SEM) to collect electron diffraction patterns at fast rate on samples comprising 2D material-based devices larger than cannot be fit or analyzed by a conventional transmission electron microscope (TEM). The diffraction patterns will be used to complement and extend existing SEM analytical capabilities, and also for the development of new imaging and diffraction modes that will be used to understand the reliability of 2D materials-based electronic devices as part of the CHIPS project entitled Evaluation of 2D and WBG Material Quality toward Device Reliability.
AvailableMicroscope, optical, NSN 6650016174340, Qty 26.
Posted Date
Jan 11, 2026
Due Date
Jan 26, 2026
Release: Jan 11, 2026
Close: Jan 26, 2026
Microscope, optical, NSN 6650016174340, Qty 26.
AvailableThis solicitation is for a Base plus Four (4) Maintenance Agreement for a TecnaiSpirit Transmission Electron Microscope (TEM). The opportunity was published on January 15, 2026, with offers due by January 22, 2026, and the performance location is Bethesda, MD. The contracting entity is the National Institutes of Health / National Heart, Lung, and Blood Institute, with Brittany N. May as the primary contact.
Posted Date
Jan 15, 2026
Due Date
Jan 22, 2026
Release: Jan 15, 2026
Close: Jan 22, 2026
This solicitation is for a Base plus Four (4) Maintenance Agreement for a TecnaiSpirit Transmission Electron Microscope (TEM). The opportunity was published on January 15, 2026, with offers due by January 22, 2026, and the performance location is Bethesda, MD. The contracting entity is the National Institutes of Health / National Heart, Lung, and Blood Institute, with Brittany N. May as the primary contact.
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