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Provide CHIPS R&D Electrical/thermal TEM holder. Provide the highly complex materials and tools used to produce semiconductors. Single-tilt TEM sample holder compatible with TFS S-Twin and S-Twin Prime Pole Piece. 1 EA. See attached file.
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Pain points mentioned in board meetings and strategic plans
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Get ahead of RFPs — target accounts planning budget or ending contracts soon
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Starbridge.ai books 30 - 40% of leads into meetings
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NIST issued a Combined Sources Sought and Notice of Intent to Sole Source (NIST-SS26-CHIPS-51) seeking a specialized TEM holder system and compatible MEMS-based chips optimized for low-noise STEM-EBIC measurement, in-situ electrical biasing, and heating to support CHIPS metrology projects. The procurement includes multiple line items (TEM holder, primary and secondary two-channel current amplification modules, power/signal processing unit, and MEMS chips) and detailed technical specifications to enable picoampere EBIC measurements. NIST states market research identified Nanoelectronic Imaging, Inc. as the only apparent capable source and requests vendor responses (not proposals) to inform future solicitation planning.
Posted Date
Dec 12, 2025
Due Date
Dec 26, 2025
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Close: Dec 26, 2025
NIST issued a Combined Sources Sought and Notice of Intent to Sole Source (NIST-SS26-CHIPS-51) seeking a specialized TEM holder system and compatible MEMS-based chips optimized for low-noise STEM-EBIC measurement, in-situ electrical biasing, and heating to support CHIPS metrology projects. The procurement includes multiple line items (TEM holder, primary and secondary two-channel current amplification modules, power/signal processing unit, and MEMS chips) and detailed technical specifications to enable picoampere EBIC measurements. NIST states market research identified Nanoelectronic Imaging, Inc. as the only apparent capable source and requests vendor responses (not proposals) to inform future solicitation planning.
AvailableNIST issued a Combined Sources Sought Notice and Notice of Intent to Sole Source seeking market research and potential sources for an in-situ electrochemical liquid TEM holder system with integrated heating and cooling. The system must be compatible with Thermo Fisher TEMs, include electrochemical three‑electrode capability, fluid delivery, MEMS liquid cell chips, and temperature control from -50 °C to 300 °C, plus software, service, and training. Responses are sought to support CHIPS R&D Metrology Grant Challenge Project 7.03 and to inform potential sole-source awarding options.
Posted Date
Dec 8, 2025
Due Date
Dec 22, 2025
Release: Dec 8, 2025
Close: Dec 22, 2025
NIST issued a Combined Sources Sought Notice and Notice of Intent to Sole Source seeking market research and potential sources for an in-situ electrochemical liquid TEM holder system with integrated heating and cooling. The system must be compatible with Thermo Fisher TEMs, include electrochemical three‑electrode capability, fluid delivery, MEMS liquid cell chips, and temperature control from -50 °C to 300 °C, plus software, service, and training. Responses are sought to support CHIPS R&D Metrology Grant Challenge Project 7.03 and to inform potential sole-source awarding options.
AvailableThe National Institute of Standards and Technology (NIST) Infrastructure and Materials Group (Engineering Laboratory) issued a Combined Sources Sought / Notice of Intent to Sole Source seeking one Extreme Thermal Cycling Chamber (–100°C to 200°C, ≥70°C/min cycling) to support CHIPS Metrology accelerated aging experiments for advanced semiconductor packaging reliability. NIST’s market research (Feb–Nov 2025) identified only ESPEC North America, Inc. as appearing capable of meeting the stated minimum requirements. This notice requests vendor responses via email with company contact, capabilities, authorization status (if reseller), SAM UEI if available, and feedback on any unduly restrictive requirements; it is NOT a grant and is a market-research/sources-sought special notice (open, response deadline Dec 26, 2025).
Posted Date
Dec 12, 2025
Due Date
Dec 26, 2025
Release: Dec 12, 2025
Close: Dec 26, 2025
The National Institute of Standards and Technology (NIST) Infrastructure and Materials Group (Engineering Laboratory) issued a Combined Sources Sought / Notice of Intent to Sole Source seeking one Extreme Thermal Cycling Chamber (–100°C to 200°C, ≥70°C/min cycling) to support CHIPS Metrology accelerated aging experiments for advanced semiconductor packaging reliability. NIST’s market research (Feb–Nov 2025) identified only ESPEC North America, Inc. as appearing capable of meeting the stated minimum requirements. This notice requests vendor responses via email with company contact, capabilities, authorization status (if reseller), SAM UEI if available, and feedback on any unduly restrictive requirements; it is NOT a grant and is a market-research/sources-sought special notice (open, response deadline Dec 26, 2025).
AvailableExtreme thermal cycling chamber. Rapid thermal cycling instrument (-100 °C to 200 °C, 70 °C/min). 1 EA.
Posted Date
Dec 12, 2025
Due Date
Dec 26, 2025
Release: Dec 12, 2025
Close: Dec 26, 2025
Extreme thermal cycling chamber. Rapid thermal cycling instrument (-100 °C to 200 °C, 70 °C/min). 1 EA.
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