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Extreme thermal cycling chamber. Rapid thermal cycling instrument (-100 °C to 200 °C, 70 °C/min). 1 EA.
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Pain points mentioned in board meetings and strategic plans
Instantly outline and draft all requirements
Bring in your USPs and exploit competitor gaps
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Get ahead of RFPs — target accounts planning budget or ending contracts soon
Accounts with contract expirations, meetings mentioning your product, grants, budget changes and more
Starbridge.ai books 30 - 40% of leads into meetings
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The National Institute of Standards and Technology (NIST) Infrastructure and Materials Group (Engineering Laboratory) issued a Combined Sources Sought / Notice of Intent to Sole Source seeking one Extreme Thermal Cycling Chamber (–100°C to 200°C, ≥70°C/min cycling) to support CHIPS Metrology accelerated aging experiments for advanced semiconductor packaging reliability. NIST’s market research (Feb–Nov 2025) identified only ESPEC North America, Inc. as appearing capable of meeting the stated minimum requirements. This notice requests vendor responses via email with company contact, capabilities, authorization status (if reseller), SAM UEI if available, and feedback on any unduly restrictive requirements; it is NOT a grant and is a market-research/sources-sought special notice (open, response deadline Dec 26, 2025).
Posted Date
Dec 12, 2025
Due Date
Dec 26, 2025
Release: Dec 12, 2025
Close: Dec 26, 2025
The National Institute of Standards and Technology (NIST) Infrastructure and Materials Group (Engineering Laboratory) issued a Combined Sources Sought / Notice of Intent to Sole Source seeking one Extreme Thermal Cycling Chamber (–100°C to 200°C, ≥70°C/min cycling) to support CHIPS Metrology accelerated aging experiments for advanced semiconductor packaging reliability. NIST’s market research (Feb–Nov 2025) identified only ESPEC North America, Inc. as appearing capable of meeting the stated minimum requirements. This notice requests vendor responses via email with company contact, capabilities, authorization status (if reseller), SAM UEI if available, and feedback on any unduly restrictive requirements; it is NOT a grant and is a market-research/sources-sought special notice (open, response deadline Dec 26, 2025).
AvailableThe National Institute of Standards and Technology (NIST) seeks information via a combined Sources Sought and Notice of Intent to Sole Source for a tunable 780 nm diode laser to perform interferometry-based mass sensing for atomic layer deposition (ALD) process metrology. NIST's market research identified Toptica Photonics Inc as the only source that appears capable of meeting the stated requirements and the agency states an intent to sole source if no alternate sources are identified. Responses should be submitted by email to the Primary Point of Contact by the response deadline and do not require submission of proprietary information.
Posted Date
Dec 12, 2025
Due Date
Dec 26, 2025
Release: Dec 12, 2025
Close: Dec 26, 2025
The National Institute of Standards and Technology (NIST) seeks information via a combined Sources Sought and Notice of Intent to Sole Source for a tunable 780 nm diode laser to perform interferometry-based mass sensing for atomic layer deposition (ALD) process metrology. NIST's market research identified Toptica Photonics Inc as the only source that appears capable of meeting the stated requirements and the agency states an intent to sole source if no alternate sources are identified. Responses should be submitted by email to the Primary Point of Contact by the response deadline and do not require submission of proprietary information.
AvailableThe National Institute of Standards and Technology (NIST) seeks information via a combined Sources Sought and Notice of Intent to Sole Source for a tunable 780 nm diode laser to perform interferometry-based mass sensing for atomic layer deposition (ALD) process metrology. NIST's market research identified Toptica Photonics Inc as the only source that appears capable of meeting the stated requirements and the agency states an intent to sole source if no alternate sources are identified. Responses should be submitted by email to the Primary Point of Contact by the response deadline and do not require submission of proprietary information.
Posted Date
Dec 12, 2025
Due Date
Dec 26, 2025
Release: Dec 12, 2025
Close: Dec 26, 2025
The National Institute of Standards and Technology (NIST) seeks information via a combined Sources Sought and Notice of Intent to Sole Source for a tunable 780 nm diode laser to perform interferometry-based mass sensing for atomic layer deposition (ALD) process metrology. NIST's market research identified Toptica Photonics Inc as the only source that appears capable of meeting the stated requirements and the agency states an intent to sole source if no alternate sources are identified. Responses should be submitted by email to the Primary Point of Contact by the response deadline and do not require submission of proprietary information.
AvailableNIST issued a Combined Sources Sought and Notice of Intent to Sole Source (NIST-SS26-CHIPS-51) seeking a specialized TEM holder system and compatible MEMS-based chips optimized for low-noise STEM-EBIC measurement, in-situ electrical biasing, and heating to support CHIPS metrology projects. The procurement includes multiple line items (TEM holder, primary and secondary two-channel current amplification modules, power/signal processing unit, and MEMS chips) and detailed technical specifications to enable picoampere EBIC measurements. NIST states market research identified Nanoelectronic Imaging, Inc. as the only apparent capable source and requests vendor responses (not proposals) to inform future solicitation planning.
Posted Date
Dec 12, 2025
Due Date
Dec 26, 2025
Release: Dec 12, 2025
Close: Dec 26, 2025
NIST issued a Combined Sources Sought and Notice of Intent to Sole Source (NIST-SS26-CHIPS-51) seeking a specialized TEM holder system and compatible MEMS-based chips optimized for low-noise STEM-EBIC measurement, in-situ electrical biasing, and heating to support CHIPS metrology projects. The procurement includes multiple line items (TEM holder, primary and secondary two-channel current amplification modules, power/signal processing unit, and MEMS chips) and detailed technical specifications to enable picoampere EBIC measurements. NIST states market research identified Nanoelectronic Imaging, Inc. as the only apparent capable source and requests vendor responses (not proposals) to inform future solicitation planning.
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