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National Institute of Standards and Technology
The National Institute of Standards and Technology (NIST) issued a Sources Sought (NIST-SS26-CHIPS-36) requesting information from vendors for a Vector Network Analyzer to support the RF Waveform and Rapid Frequency-Comb Diagnostics for Plasma Etching project under the CHIPS metrology program. The notice lists minimum technical requirements including operation from at least 200 kHz to 8 GHz, direct receiver access, ability to measure harmonics and intermodulation products (frequency-offset measurements) and four measurement ports, plus optional line items for attenuators and additional LO/RF sources. Respondents are instructed to submit company/contact information, capabilities, past performance, and non-proprietary details by email to the primary contact; the sources-sought is due Dec 15, 2025 at 5:00 p.m. EST.
Pain points mentioned in board meetings and strategic plans
Instantly outline and draft all requirements
Bring in your USPs and exploit competitor gaps
Get ahead of RFPs — target accounts planning budget or ending contracts soon
Accounts with contract expirations, meetings mentioning your product, grants, budget changes and more
Starbridge.ai books 30 - 40% of leads into meetings
No files attached to this RFP.
Many agencies add documentation later or require FOIA requests. Starbridge can automatically retrieve these files for you.
National Institute of Standards and Technology
The National Institute of Standards and Technology (NIST) issued a Sources Sought (NIST-SS26-CHIPS-25) to conduct market research and identify potential sources for a Coupled Device Detector Camera System under the CHIPS RF Waveform and Rapid Frequency Comb Diagnostics for Plasma Etching Project. NIST requests one camera with an integrated intensifier and IEMCCD sensor (specified performance parameters) plus control/data analysis software compatible with NIST-supplied computers. Responses are due Dec 15, 2025; the notice is a sources-sought market research notice (not a grant) and is listed on SAM.gov.
Posted Date
Dec 1, 2025
Due Date
Dec 15, 2025
Release: Dec 1, 2025
National Institute of Standards and Technology
Close: Dec 15, 2025
Verified names, emails & phone numbers
AI-predicted best buyers in the org
Auto-sync to Salesforce & HubSpot
Access the largest public sector contact database
See which competitors are likely to bid
Line-item pricing breakdowns
Contract expiration map of your TAM
Get complete source documentation & analysis
The National Institute of Standards and Technology (NIST) issued a Sources Sought (NIST-SS26-CHIPS-25) to conduct market research and identify potential sources for a Coupled Device Detector Camera System under the CHIPS RF Waveform and Rapid Frequency Comb Diagnostics for Plasma Etching Project. NIST requests one camera with an integrated intensifier and IEMCCD sensor (specified performance parameters) plus control/data analysis software compatible with NIST-supplied computers. Responses are due Dec 15, 2025; the notice is a sources-sought market research notice (not a grant) and is listed on SAM.gov.
National Institute of Standards and Technology
The National Institute of Standards and Technology (NIST) issued a Sources Sought to conduct market research for X-ray computed tomography (XCT) simulation software to support the NIST CHIPS Metrology R&D program. NIST seeks a permanent software license for an XCT simulation package (Line Item 0001) plus a maintenance contract including the first year (Line Item 0002) capable of simulating a wide energy range, geometries, detector configurations, and supporting Python scripting and reconstruction outputs. Responses are for market research (sources sought), not a grant; place of performance is Gaithersburg, MD and the notice is open with a stated response deadline of Dec 15, 2025, 12:00 p.m. EST.
Posted Date
Dec 1, 2025
Due Date
Dec 15, 2025
Release: Dec 1, 2025
National Institute of Standards and Technology
Close: Dec 15, 2025
The National Institute of Standards and Technology (NIST) issued a Sources Sought to conduct market research for X-ray computed tomography (XCT) simulation software to support the NIST CHIPS Metrology R&D program. NIST seeks a permanent software license for an XCT simulation package (Line Item 0001) plus a maintenance contract including the first year (Line Item 0002) capable of simulating a wide energy range, geometries, detector configurations, and supporting Python scripting and reconstruction outputs. Responses are for market research (sources sought), not a grant; place of performance is Gaithersburg, MD and the notice is open with a stated response deadline of Dec 15, 2025, 12:00 p.m. EST.
AvailableNational Institute of Standards and Technology
The National Institute of Standards and Technology (NIST) issued a Sources Sought notice seeking two scientific CMOS cameras to support the Digital Twins for Atomic Layer Deposition Processes Project. Cameras must meet high-sensitivity, high-speed specifications across ultravioletvisible wavelengths (detailed sensor QE, pixel format, readout rate, shutter, noise, dark current, and temperature requirements) and may include accessories (frame grabber, cables, refrigerated chiller). The notice is posted as an open sources-sought procurement with delivery to the NIST MML/646 lab in Gaithersburg, MD; responses are due Dec 15, 2025 at 12:00 p.m. EST.
Posted Date
Dec 1, 2025
Due Date
Dec 15, 2025
Release: Dec 1, 2025
National Institute of Standards and Technology
Close: Dec 15, 2025
The National Institute of Standards and Technology (NIST) issued a Sources Sought notice seeking two scientific CMOS cameras to support the Digital Twins for Atomic Layer Deposition Processes Project. Cameras must meet high-sensitivity, high-speed specifications across ultravioletvisible wavelengths (detailed sensor QE, pixel format, readout rate, shutter, noise, dark current, and temperature requirements) and may include accessories (frame grabber, cables, refrigerated chiller). The notice is posted as an open sources-sought procurement with delivery to the NIST MML/646 lab in Gaithersburg, MD; responses are due Dec 15, 2025 at 12:00 p.m. EST.
AvailableNational Institute of Standards and Technology
The National Institute of Standards and Technology (NIST) issued a sources-sought/pre-solicitation (NIST-SS26-CHIPS-36) seeking vendors for a Vector Network Analyzer to support high-power RF waveform metrology in semiconductor plasma processing research under the CHIPS metrology program. The notice requests vendor capability information (market research) rather than an immediate procurement and does not list quantities, incumbent, or award value. Responses are due December 15, 2025 and the original posting is on SAM.gov.
Posted Date
Dec 8, 2025
Due Date
Dec 15, 2025
Release: Dec 8, 2025
National Institute of Standards and Technology
Close: Dec 15, 2025
The National Institute of Standards and Technology (NIST) issued a sources-sought/pre-solicitation (NIST-SS26-CHIPS-36) seeking vendors for a Vector Network Analyzer to support high-power RF waveform metrology in semiconductor plasma processing research under the CHIPS metrology program. The notice requests vendor capability information (market research) rather than an immediate procurement and does not list quantities, incumbent, or award value. Responses are due December 15, 2025 and the original posting is on SAM.gov.
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