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Department of Commerce
This is a Sources Sought (market research) notice from the National Institute of Standards and Technology (NIST) requesting industry information on high-power dual directional couplers to support RF waveform and rapid frequency-comb diagnostics for plasma etching. The couplers must support high-power waveforms (up to 5 kW) and will be used in a laboratory environment; NIST intends to use responses to determine an appropriate acquisition strategy and may later issue an RFQ/RFP. Responses are due Dec 8, 2025; this notice is not a solicitation and will not result in award.
Pain points mentioned in board meetings and strategic plans
Instantly outline and draft all requirements
Bring in your USPs and exploit competitor gaps
Get ahead of RFPs — target accounts planning budget or ending contracts soon
Accounts with contract expirations, meetings mentioning your product, grants, budget changes and more
Starbridge.ai books 30 - 40% of leads into meetings
No files attached to this RFP.
Many agencies add documentation later or require FOIA requests. Starbridge can automatically retrieve these files for you.
National Institute of Standards and Technology
The National Institute of Standards and Technology (NIST) issued a Sources Sought (NIST-SS26-CHIPS-25) to conduct market research and identify potential sources for a Coupled Device Detector Camera System under the CHIPS RF Waveform and Rapid Frequency Comb Diagnostics for Plasma Etching Project. NIST requests one camera with an integrated intensifier and IEMCCD sensor (specified performance parameters) plus control/data analysis software compatible with NIST-supplied computers. Responses are due Dec 15, 2025; the notice is a sources-sought market research notice (not a grant) and is listed on SAM.gov.
Posted Date
Dec 1, 2025
Due Date
Dec 15, 2025
Release: Dec 1, 2025
National Institute of Standards and Technology
Close: Dec 15, 2025
Verified names, emails & phone numbers
AI-predicted best buyers in the org
Auto-sync to Salesforce & HubSpot
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The National Institute of Standards and Technology (NIST) issued a Sources Sought (NIST-SS26-CHIPS-25) to conduct market research and identify potential sources for a Coupled Device Detector Camera System under the CHIPS RF Waveform and Rapid Frequency Comb Diagnostics for Plasma Etching Project. NIST requests one camera with an integrated intensifier and IEMCCD sensor (specified performance parameters) plus control/data analysis software compatible with NIST-supplied computers. Responses are due Dec 15, 2025; the notice is a sources-sought market research notice (not a grant) and is listed on SAM.gov.
National Institute of Standards and Technology
The National Institute of Standards and Technology (NIST) issued a Sources Sought notice seeking two scientific CMOS cameras to support the Digital Twins for Atomic Layer Deposition Processes Project. Cameras must meet high-sensitivity, high-speed specifications across ultravioletvisible wavelengths (detailed sensor QE, pixel format, readout rate, shutter, noise, dark current, and temperature requirements) and may include accessories (frame grabber, cables, refrigerated chiller). The notice is posted as an open sources-sought procurement with delivery to the NIST MML/646 lab in Gaithersburg, MD; responses are due Dec 15, 2025 at 12:00 p.m. EST.
Posted Date
Dec 1, 2025
Due Date
Dec 15, 2025
Release: Dec 1, 2025
National Institute of Standards and Technology
Close: Dec 15, 2025
The National Institute of Standards and Technology (NIST) issued a Sources Sought notice seeking two scientific CMOS cameras to support the Digital Twins for Atomic Layer Deposition Processes Project. Cameras must meet high-sensitivity, high-speed specifications across ultravioletvisible wavelengths (detailed sensor QE, pixel format, readout rate, shutter, noise, dark current, and temperature requirements) and may include accessories (frame grabber, cables, refrigerated chiller). The notice is posted as an open sources-sought procurement with delivery to the NIST MML/646 lab in Gaithersburg, MD; responses are due Dec 15, 2025 at 12:00 p.m. EST.
AvailableNational Institute of Standards and Technology
The National Institute of Standards and Technology (NIST) issued a Sources Sought to conduct market research for X-ray computed tomography (XCT) simulation software to support the NIST CHIPS Metrology R&D program. NIST seeks a permanent software license for an XCT simulation package (Line Item 0001) plus a maintenance contract including the first year (Line Item 0002) capable of simulating a wide energy range, geometries, detector configurations, and supporting Python scripting and reconstruction outputs. Responses are for market research (sources sought), not a grant; place of performance is Gaithersburg, MD and the notice is open with a stated response deadline of Dec 15, 2025, 12:00 p.m. EST.
Posted Date
Dec 1, 2025
Due Date
Dec 15, 2025
Release: Dec 1, 2025
National Institute of Standards and Technology
Close: Dec 15, 2025
The National Institute of Standards and Technology (NIST) issued a Sources Sought to conduct market research for X-ray computed tomography (XCT) simulation software to support the NIST CHIPS Metrology R&D program. NIST seeks a permanent software license for an XCT simulation package (Line Item 0001) plus a maintenance contract including the first year (Line Item 0002) capable of simulating a wide energy range, geometries, detector configurations, and supporting Python scripting and reconstruction outputs. Responses are for market research (sources sought), not a grant; place of performance is Gaithersburg, MD and the notice is open with a stated response deadline of Dec 15, 2025, 12:00 p.m. EST.
AvailableNational Institute of Standards and Technology
This is a combined Sources Sought notice and Notice of Intent to Sole Source issued by the National Institute of Standards and Technology (NIST) seeking market research and potential sources for a compressed sensing scan generator for SEM-based IC overlay metrology. NIST indicates it may sole-source to Panoscientific, LLC if no alternate sources are identified and requests capability statements and technical details from interested vendors. The notice is for market research (not a solicitation or grant), responses are emailed to the listed POCs, and the government may later publish a solicitation on SAM.gov or other platforms.
Posted Date
Dec 4, 2025
Due Date
Dec 18, 2025
Release: Dec 4, 2025
National Institute of Standards and Technology
Close: Dec 18, 2025
This is a combined Sources Sought notice and Notice of Intent to Sole Source issued by the National Institute of Standards and Technology (NIST) seeking market research and potential sources for a compressed sensing scan generator for SEM-based IC overlay metrology. NIST indicates it may sole-source to Panoscientific, LLC if no alternate sources are identified and requests capability statements and technical details from interested vendors. The notice is for market research (not a solicitation or grant), responses are emailed to the listed POCs, and the government may later publish a solicitation on SAM.gov or other platforms.
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