Discover Opportunities months before the RFP drops
Learn more →Retrieving RFP details
Starbridge can help you:
Pain points mentioned in board meetings and strategic plans
Instantly outline and draft all requirements
Bring in your USPs and exploit competitor gaps
Starbridge can help you:
Get ahead of RFPs — target accounts planning budget or ending contracts soon
Accounts with contract expirations, meetings mentioning your product, grants, budget changes and more
Starbridge.ai books 30 - 40% of leads into meetings
Premium
Access the largest public sector contact database
Premium
Get complete source documentation & analysis
The National Institute of Standards and Technology (NIST) posted a Sources Sought notice seeking information for the procurement of one optical microscope to support CHIPS metrology R&D, focused on nondestructive defect detection and characterization of semiconductor samples. The notice specifies technical requirements including an upright reflected-light microscope with LED illumination, motorized stages, autofocus, multiple objective lenses, digital imaging integration, and computer control. This is a market-research Sources Sought (not a grant) posted Dec 9, 2025 with responses due Dec 23, 2025; no solicitation PDF was available on the GovTribe page.
Starbridge can help you:
Pain points mentioned in board meetings and strategic plans
Instantly outline and draft all requirements
Bring in your USPs and exploit competitor gaps
Starbridge can help you:
Get ahead of RFPs — target accounts planning budget or ending contracts soon
Accounts with contract expirations, meetings mentioning your product, grants, budget changes and more
Starbridge.ai books 30 - 40% of leads into meetings
No files attached to this RFP.
Many agencies add documentation later or require FOIA requests. Starbridge can automatically retrieve these files for you.
1 ea, optical microscope.
Posted Date
Dec 9, 2025
Due Date
Dec 23, 2025
Release: Dec 9, 2025
Close: Dec 23, 2025
1 ea, optical microscope.
AvailableNIST issued a Sources Sought notice (NIST-SS26-CHIPS-42) seeking information for an optical microscope to support nondestructive defect detection metrology for semiconductor advanced packaging. The notice lists detailed hardware, camera, motorized stage, objective lens, and software requirements and requests capability statements and other market research information via email to the primary point of contact. Questions must be submitted by December 15, 2025, and responses are due by December 23, 2025 at 5:00 p.m. EST.
Posted Date
Dec 9, 2025
Due Date
Dec 23, 2025
Release: Dec 9, 2025
Close: Dec 23, 2025
NIST issued a Sources Sought notice (NIST-SS26-CHIPS-42) seeking information for an optical microscope to support nondestructive defect detection metrology for semiconductor advanced packaging. The notice lists detailed hardware, camera, motorized stage, objective lens, and software requirements and requests capability statements and other market research information via email to the primary point of contact. Questions must be submitted by December 15, 2025, and responses are due by December 23, 2025 at 5:00 p.m. EST.
1 ea, atomic force microscope (AFM).
Posted Date
Dec 4, 2025
Due Date
Dec 17, 2025
Release: Dec 4, 2025
Close: Dec 17, 2025
1 ea, atomic force microscope (AFM).
AvailableConfocal microscope system.
Posted Date
Dec 10, 2025
Due Date
Dec 18, 2025
Release: Dec 10, 2025
Close: Dec 18, 2025
Confocal microscope system.
AvailableSurface intent from meeting minutes, budgets, and contract expirations. Influence RFP requirements before competitors ever see them.
See your top 10 upcoming opportunities on a demo →Premium
Access the largest public sector contact database
Premium
Get complete source documentation & analysis